Microelectronic Test Structures for Cmos Technology - Manjul Bhushan - Books - Springer-Verlag New York Inc. - 9781489990556 - October 1, 2014
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Manjul Bhushan
Microelectronic Test Structures for Cmos Technology

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Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.

373 pages, 37 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 1, 2014
ISBN13 9781489990556
Publishers Springer-Verlag New York Inc.
Pages 373
Dimensions 155 × 235 × 21 mm   ·   566 g
Language English  

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